Dielectric material measurement of thin samples at millimeter wavelengths

Dielectric material measurement of thin samples at millimeter wavelengths

Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5-GHz to 40-GHz (R-band) frequency range are described....

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 1992-10, Vol.41 (5), p.723-725
Hauptverfasser: Dudeck, K.E., Buckley, L.J.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Delay
Dielectric materials
Dielectric measurements
Electronics
Exact sciences and technology
Frequency
Millimeter wave measurements
Millimeter wave technology
Miscellaneous
Permeability
Permittivity measurement
Polymers
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Wavelength measurement
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Zusammenfassung:Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5-GHz to 40-GHz (R-band) frequency range are described. Measurement results for various dielectric materials are included.< >
ISSN:0018-9456
1557-9662
DOI:10.1109/19.177352