Bayes comparison of 2 lognormal reliability functions

Bayes comparison of 2 lognormal reliability functions

A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approxima...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on reliability 1990-08, Vol.39 (3), p.336-341
Hauptverfasser: SELBY, M. A, SHOUKRI, M. M
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Exact sciences and technology
Operational research and scientific management
Operational research. Management science
Reliability theory. Replacement problems
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 341
container_issue 3
container_start_page 336
container_title IEEE transactions on reliability
container_volume 39
creator SELBY, M. A
SHOUKRI, M. M
description A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on Student t-distribution. Analytic foundations of the conclusions are provided. (I.E.)
doi_str_mv 10.1109/24.103014
format Article
fullrecord <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_miscellaneous_25581692</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>25581692</sourcerecordid><originalsourceid>FETCH-LOGICAL-p214t-c7d9df9e144add624971931190b40a6030c86323f1ae95af07423c888ef35a3d3</originalsourceid><addsrcrecordid>eNotj09LxDAUxIMoWFcPfoNe9NY17yVtk6Mu_oMFL3oub9NEImlTk-6h396CexoGhvnNMHYLfAvA9QPKLXDBQZ6xAupaVdAinLOCc1CVrlFfsqucf1YrpVYFq59osbk0cZgo-RzHMroSyxC_x5gGCmWywdPBBz8vpTuOZvZxzNfswlHI9uakG_b18vy5e6v2H6_vu8d9NSHIuTJtr3un7cqivm9Q6ha0AND8IDk1606jGoHCAVldk-OtRGGUUtaJmkQvNuz-v3dK8fdo89wNPhsbAo02HnOH60NoNK7Bu1OQsqHgEo3G525KfqC0dKBxpSGKP3z2U3Y</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25581692</pqid></control><display><type>article</type><title>Bayes comparison of 2 lognormal reliability functions</title><source>IEEE Electronic Library (IEL)</source><creator>SELBY, M. A ; SHOUKRI, M. M</creator><creatorcontrib>SELBY, M. A ; SHOUKRI, M. M</creatorcontrib><description>A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on Student t-distribution. Analytic foundations of the conclusions are provided. (I.E.)</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/24.103014</identifier><identifier>CODEN: IEERAJ</identifier><language>eng</language><publisher>New York, NY: Institute of Electrical and Electronics Engineers</publisher><subject>Applied sciences ; Exact sciences and technology ; Operational research and scientific management ; Operational research. Management science ; Reliability theory. Replacement problems</subject><ispartof>IEEE transactions on reliability, 1990-08, Vol.39 (3), p.336-341</ispartof><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=19260322$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>SELBY, M. A</creatorcontrib><creatorcontrib>SHOUKRI, M. M</creatorcontrib><title>Bayes comparison of 2 lognormal reliability functions</title><title>IEEE transactions on reliability</title><description>A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on Student t-distribution. Analytic foundations of the conclusions are provided. (I.E.)</description><subject>Applied sciences</subject><subject>Exact sciences and technology</subject><subject>Operational research and scientific management</subject><subject>Operational research. Management science</subject><subject>Reliability theory. Replacement problems</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNotj09LxDAUxIMoWFcPfoNe9NY17yVtk6Mu_oMFL3oub9NEImlTk-6h396CexoGhvnNMHYLfAvA9QPKLXDBQZ6xAupaVdAinLOCc1CVrlFfsqucf1YrpVYFq59osbk0cZgo-RzHMroSyxC_x5gGCmWywdPBBz8vpTuOZvZxzNfswlHI9uakG_b18vy5e6v2H6_vu8d9NSHIuTJtr3un7cqivm9Q6ha0AND8IDk1606jGoHCAVldk-OtRGGUUtaJmkQvNuz-v3dK8fdo89wNPhsbAo02HnOH60NoNK7Bu1OQsqHgEo3G525KfqC0dKBxpSGKP3z2U3Y</recordid><startdate>19900801</startdate><enddate>19900801</enddate><creator>SELBY, M. A</creator><creator>SHOUKRI, M. M</creator><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19900801</creationdate><title>Bayes comparison of 2 lognormal reliability functions</title><author>SELBY, M. A ; SHOUKRI, M. M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p214t-c7d9df9e144add624971931190b40a6030c86323f1ae95af07423c888ef35a3d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>Applied sciences</topic><topic>Exact sciences and technology</topic><topic>Operational research and scientific management</topic><topic>Operational research. Management science</topic><topic>Reliability theory. Replacement problems</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SELBY, M. A</creatorcontrib><creatorcontrib>SHOUKRI, M. M</creatorcontrib><collection>Pascal-Francis</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SELBY, M. A</au><au>SHOUKRI, M. M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bayes comparison of 2 lognormal reliability functions</atitle><jtitle>IEEE transactions on reliability</jtitle><date>1990-08-01</date><risdate>1990</risdate><volume>39</volume><issue>3</issue><spage>336</spage><epage>341</epage><pages>336-341</pages><issn>0018-9529</issn><eissn>1558-1721</eissn><coden>IEERAJ</coden><abstract>A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on Student t-distribution. Analytic foundations of the conclusions are provided. (I.E.)</abstract><cop>New York, NY</cop><pub>Institute of Electrical and Electronics Engineers</pub><doi>10.1109/24.103014</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0018-9529
ispartof IEEE transactions on reliability, 1990-08, Vol.39 (3), p.336-341
issn 0018-9529
1558-1721
language eng
recordid cdi_proquest_miscellaneous_25581692
source IEEE Electronic Library (IEL)
subjects Applied sciences
Exact sciences and technology
Operational research and scientific management
Operational research. Management science
Reliability theory. Replacement problems
title Bayes comparison of 2 lognormal reliability functions
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T05%3A53%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Bayes%20comparison%20of%202%20lognormal%20reliability%20functions&rft.jtitle=IEEE%20transactions%20on%20reliability&rft.au=SELBY,%20M.%20A&rft.date=1990-08-01&rft.volume=39&rft.issue=3&rft.spage=336&rft.epage=341&rft.pages=336-341&rft.issn=0018-9529&rft.eissn=1558-1721&rft.coden=IEERAJ&rft_id=info:doi/10.1109/24.103014&rft_dat=%3Cproquest_pasca%3E25581692%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25581692&rft_id=info:pmid/&rfr_iscdi=true