Bayes comparison of 2 lognormal reliability functions
A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approxima...
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Veröffentlicht in: | IEEE transactions on reliability 1990-08, Vol.39 (3), p.336-341 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on Student t-distribution. Analytic foundations of the conclusions are provided. (I.E.) |
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ISSN: | 0018-9529 1558-1721 |
DOI: | 10.1109/24.103014 |