Direct cross‐sectional imaging using X‐ray Compton scattering: application to commercial batteries

A synchrotron‐based technique using Compton scattering imaging is presented. This technique has been applied to a coin battery (CR2023), and the cross‐sectional image has been obtained in 34 ms without sample rotation. A three‐dimensional image of the whole structure has been reconstructed from 74 c...

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Veröffentlicht in:Journal of synchrotron radiation 2021-07, Vol.28 (4), p.1174-1177
Hauptverfasser: Tsuji, Naruki, Kajiwara, Kentaro, Itou, Masayoshi, Sakurai, Yoshiharu
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Sprache:eng
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Zusammenfassung:A synchrotron‐based technique using Compton scattering imaging is presented. This technique has been applied to a coin battery (CR2023), and the cross‐sectional image has been obtained in 34 ms without sample rotation. A three‐dimensional image of the whole structure has been reconstructed from 74 cross‐sectional images taken consecutively by scanning the incident, wide X‐ray beam along one direction. This work demonstrates that quick cross‐sectional imaging of regions of interest and three‐dimensional image reconstruction without sample rotation are feasible using Compton scattering imaging. Compton scattering imaging has been applied to coin batteries to obtain their cross‐sectional images directly.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577521005932