Sub-30-ps ECL circuit operation at liquid-nitrogen temperature using self-aligned epitaxial SiGe-base bipolar transistors

The authors report the operation of emitter coupled logic (ECL) circuits at liquid-nitrogen temperature using self-aligned epitaxial SiGe-base bipolar transistors. A minimum ECL gate delay of 28.1 ps at 84 K was measured; this is essentially unchanged from the room-temperature value of 28.8 ps at 31...

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Veröffentlicht in:IEEE electron device letters 1991-04, Vol.12 (4), p.166-168
Hauptverfasser: Cressler, J.D., Comfort, J.H., Crabbe, E.F., Patton, G.L., Lee, W., Sun, J.Y., Stork, J.M.C., Meyerson, B.S.
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Sprache:eng
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Zusammenfassung:The authors report the operation of emitter coupled logic (ECL) circuits at liquid-nitrogen temperature using self-aligned epitaxial SiGe-base bipolar transistors. A minimum ECL gate delay of 28.1 ps at 84 K was measured; this is essentially unchanged from the room-temperature value of 28.8 ps at 310 K. This delay number was achieved under full logic-swing (500-mV) conditions and represents an improvement of greater than a factor of 2 over the best reported value for 84 K operation. Lower-power ECL circuits have switching speeds as fast as 51 ps at 2.2 mW (112-fJ power-delay product) at 84 K. These results suggest that silicon-based bipolar technology is suitable for very-high-speed applications in cryogenic computer systems.< >
ISSN:0741-3106
1558-0563
DOI:10.1109/55.75752