A methodology for the design of SFS/SCD circuits for a class of unordered codes
We present two design methods that produce concurrently testable and cascadable combinational blocks for a given logic function. In the first method, the designed block is strongly fault-secure and code-disjoint. Any unordered coding scheme can be used for the input and output. The second method pro...
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Veröffentlicht in: | Journal of electronic testing 1991-08, Vol.2 (3), p.261-277 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We present two design methods that produce concurrently testable and cascadable combinational blocks for a given logic function. In the first method, the designed block is strongly fault-secure and code-disjoint. Any unordered coding scheme can be used for the input and output. The second method produces designs that are strongly fault-secure and strongly code-disjoint. Here the encoding requires some simple density properties that are seen to be satisfied by the commonly used coding schemes. This makes the method applicable to a larger class of coding schemes than the existing methods. We also show that our designs have lower hardware overhead. |
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ISSN: | 0923-8174 1573-0727 |
DOI: | 10.1007/BF00135442 |