A methodology for the design of SFS/SCD circuits for a class of unordered codes

We present two design methods that produce concurrently testable and cascadable combinational blocks for a given logic function. In the first method, the designed block is strongly fault-secure and code-disjoint. Any unordered coding scheme can be used for the input and output. The second method pro...

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Veröffentlicht in:Journal of electronic testing 1991-08, Vol.2 (3), p.261-277
Hauptverfasser: Pagey, Sandeep, Sherlekar, S. D., Venkatesh, G.
Format: Artikel
Sprache:eng
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Zusammenfassung:We present two design methods that produce concurrently testable and cascadable combinational blocks for a given logic function. In the first method, the designed block is strongly fault-secure and code-disjoint. Any unordered coding scheme can be used for the input and output. The second method produces designs that are strongly fault-secure and strongly code-disjoint. Here the encoding requires some simple density properties that are seen to be satisfied by the commonly used coding schemes. This makes the method applicable to a larger class of coding schemes than the existing methods. We also show that our designs have lower hardware overhead.
ISSN:0923-8174
1573-0727
DOI:10.1007/BF00135442