Photometric constraint for absolute phase unwrapping from single-frequency fringe patterns

As a fundamental step in fringe projection profilometry, absolute phase unwrapping via single-frequency fringe patterns is still a challenging ill-posed problem, which attracts lots of interest in the research area. To solve the problem above, additional constraints were constructed, such as spatial...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Optics express 2021-04, Vol.29 (8), p.12663-12680
Hauptverfasser: Qi, Zhaoshuai, Liu, Xiaojun, Wang, Zhao, Yang, Jiaqi, Zhang, Yanning
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:As a fundamental step in fringe projection profilometry, absolute phase unwrapping via single-frequency fringe patterns is still a challenging ill-posed problem, which attracts lots of interest in the research area. To solve the problem above, additional constraints were constructed, such as spatial smoothness constraint (SSC) in spatial phase unwrapping algorithm and viewpoint consistency constraint (VCC) in multi-view systems (e.g., stereo and light-field cameras). However, there still exists phase ambiguity in the unwrapping result based on SSC. Moreover, VCC-based methods rely on additional cameras or light-field cameras, which makes the system complicated and expensive. In this paper, we propose to construct a novel constraint directly from photometric information in captured image intensity, which has never been fully exploited in phase unwrapping. The proposed constraint, named photometric constraint (PC), provides a prospective constraint for absolute phase unwrapping from single-frequency fringe patterns without any additional cameras. Extensive experiments have been conducted for the validation of the proposed method, which achieved comparable performance with the state-of-the-art method, given a traditional camera-projector setup and single high-frequency fringe patterns.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.420127