Flexible, fast, and benchmarked vectorial model for focused laser beams

In-bulk processing of materials by laser radiation has largely evolved over the last decades and still opens up new scientific and industrial potentials. The development of any in-bulk processing application relies on the knowledge of laser propagation and especially the volumetric field distributio...

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Veröffentlicht in:Applied optics (2004) 2021-05, Vol.60 (13), p.3954-3963
Hauptverfasser: Li, Qingfeng, Chambonneau, Maxime, Blothe, Markus, Gross, Herbert, Nolte, Stefan
Format: Artikel
Sprache:eng
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Zusammenfassung:In-bulk processing of materials by laser radiation has largely evolved over the last decades and still opens up new scientific and industrial potentials. The development of any in-bulk processing application relies on the knowledge of laser propagation and especially the volumetric field distribution near the focus. Many commercial programs can simulate this, but, to adapt them, or to develop new methods, one usually must create a specific software. Besides, most of the time people also need to measure the actual field distribution near the focus to evaluate their assumptions in the simulation. To easily get access to this knowledge, we present our high-precision field distribution measuring method and release our in-house software InFocus [https://github.com/QF06/InFocus], under the Creative Commons 4.0 license. Our measurements provide 300 nm longitudinal resolution and diffraction limited lateral resolution. The in-house software allows fast vectorial analysis of the focused volumetric field distribution in bulk. Simulations of the linear propagation of light under different conditions (focusing optics, wavelength, spatial shape, and propagation medium) are in excellent agreement with propagation imaging experiments. The aberrations provoked by the refractive index mismatch as well as those induced by the focusing optics are both taken into account. The results indicate that our proposed model is suitable for the precise evaluation of energy deposition.
ISSN:1559-128X
2155-3165
1539-4522
DOI:10.1364/AO.421945