Compound Bragg reflection filters made by spatial frequency doubling lithography

A report is presented on the fabrication of complex Bragg filters with resonant wavelengths near 1.55 mu m, patterned by photolithography using a high-resolution deep ultraviolet stepper. The projection of gratings with quarter-micrometer features was made possible by the use of spatial frequency-do...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of lightwave technology 1989-09, Vol.7 (9), p.1379-1385, Article 1379
Hauptverfasser: Henry, C.H., Shani, Y., Kistler, R.C., Jewell, T.E., Pol, V., Olsson, N.A., Kazarinov, R.F., Orlowsky, K.J.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A report is presented on the fabrication of complex Bragg filters with resonant wavelengths near 1.55 mu m, patterned by photolithography using a high-resolution deep ultraviolet stepper. The projection of gratings with quarter-micrometer features was made possible by the use of spatial frequency-doubling lithography. A single chip, processed entirely in the silicon facility, was used to demonstrate five Bragg reflectors of different wavelengths, a quarter-wave shifted resonator, broadband stacked filters with as many as 15 uniform Bragg reflector sections of different Bragg wavelengths, and broadband stacked filters containing a passband within the reflection band. The filters exhibited nearly ideal spectral behavior.< >
ISSN:0733-8724
1558-2213
DOI:10.1109/50.50717