Compound Bragg reflection filters made by spatial frequency doubling lithography
A report is presented on the fabrication of complex Bragg filters with resonant wavelengths near 1.55 mu m, patterned by photolithography using a high-resolution deep ultraviolet stepper. The projection of gratings with quarter-micrometer features was made possible by the use of spatial frequency-do...
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Veröffentlicht in: | Journal of lightwave technology 1989-09, Vol.7 (9), p.1379-1385, Article 1379 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A report is presented on the fabrication of complex Bragg filters with resonant wavelengths near 1.55 mu m, patterned by photolithography using a high-resolution deep ultraviolet stepper. The projection of gratings with quarter-micrometer features was made possible by the use of spatial frequency-doubling lithography. A single chip, processed entirely in the silicon facility, was used to demonstrate five Bragg reflectors of different wavelengths, a quarter-wave shifted resonator, broadband stacked filters with as many as 15 uniform Bragg reflector sections of different Bragg wavelengths, and broadband stacked filters containing a passband within the reflection band. The filters exhibited nearly ideal spectral behavior.< > |
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ISSN: | 0733-8724 1558-2213 |
DOI: | 10.1109/50.50717 |