I-V characteristics of NbN-NbN Josephson point contacts

Current--voltage characteristics of NbN--NbN Josephson point contacts have been examined. The point contacts were formed by NbN thin films deposited on Nb or tungsten whiskers and Nb posts. The current--voltage characteristics of those contacts were investigated with and without irradiation of micro...

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Veröffentlicht in:Japanese Journal of Applied Physics 1988-04, Vol.27 (4), p.L677-L679
Hauptverfasser: OHNO, Y, MIKI, Y, GOTO, T, HARA, K
Format: Artikel
Sprache:eng
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Zusammenfassung:Current--voltage characteristics of NbN--NbN Josephson point contacts have been examined. The point contacts were formed by NbN thin films deposited on Nb or tungsten whiskers and Nb posts. The current--voltage characteristics of those contacts were investigated with and without irradiation of microwaves and far-infrared light. High values of the I sub c R sub n product and the energy gap structure were observed, which corresponded to the high-energy gap of NbN. Shapiro steps for far-infrared light up to 170 mu m were observed and the possibility of replacing Nb Josephson point contacts with NbN ones is indicated. Graphs. 7 ref.--AA
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.27.l677