I-V characteristics of NbN-NbN Josephson point contacts
Current--voltage characteristics of NbN--NbN Josephson point contacts have been examined. The point contacts were formed by NbN thin films deposited on Nb or tungsten whiskers and Nb posts. The current--voltage characteristics of those contacts were investigated with and without irradiation of micro...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1988-04, Vol.27 (4), p.L677-L679 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Current--voltage characteristics of NbN--NbN Josephson point contacts have been examined. The point contacts were formed by NbN thin films deposited on Nb or tungsten whiskers and Nb posts. The current--voltage characteristics of those contacts were investigated with and without irradiation of microwaves and far-infrared light. High values of the I sub c R sub n product and the energy gap structure were observed, which corresponded to the high-energy gap of NbN. Shapiro steps for far-infrared light up to 170 mu m were observed and the possibility of replacing Nb Josephson point contacts with NbN ones is indicated. Graphs. 7 ref.--AA |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/jjap.27.l677 |