Transient optical non-linearity in p-Si induced by a few cycle extreme THz field

We study the impact of a few cycle extreme terahertz (THz) radiation (the field strength E ∼1-15 MV/cm is well above the DC-field breakdown threshold) on a p-doped Si wafer. Pump-probe measurements of the second harmonic of a weak infrared probe were done at different THz field strengths. The second harmonic yield has an unusual temporal behavior and does not follow the common instantaneous response, ∝ TH 2. These findings were attributed to: (i) the lattice strain by the ponderomotive force of the extreme THz pulse at the maximal THz field strength below 6 MV/cm and (ii) the modulation of the THz field-induced impact ionization rate at the optical probe frequency (due to the modulation of the free carriers' drift kinetic energy from the probe field) at the THz field strength above 6-8 MV/cm.