Submicron-scale tip fabrication for magnetic force microscopy by electrolytic polishing
An electrolytic polishing technique which exposes a portion of an insulated wire and etches that portion preferentially is described. The prepared tip's configuration immediately prior to dropping off depends on the tip's weight and mechanical properties. The tip-point curvature can be bel...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1988-08, Vol.27 (8), p.1546-1547 |
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Format: | Artikel |
Sprache: | eng |
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