Submicron-scale tip fabrication for magnetic force microscopy by electrolytic polishing

An electrolytic polishing technique which exposes a portion of an insulated wire and etches that portion preferentially is described. The prepared tip's configuration immediately prior to dropping off depends on the tip's weight and mechanical properties. The tip-point curvature can be bel...

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Veröffentlicht in:	Japanese Journal of Applied Physics 1988-08, Vol.27 (8), p.1546-1547
Hauptverfasser:	IIJIMA, T, YASUDA, K
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry Colloidal state and disperse state Exact sciences and technology General and physical chemistry Physical and chemical studies. Granulometry. Electrokinetic phenomena
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	An electrolytic polishing technique which exposes a portion of an insulated wire and etches that portion preferentially is described. The prepared tip's configuration immediately prior to dropping off depends on the tip's weight and mechanical properties. The tip-point curvature can be below-submicron scale. Magnetic force imaging of recorded magnetic tape using these tips is shown.
ISSN:	0021-4922 1347-4065
DOI:	10.1143/jjap.27.1546