Separation of magnetic and topographic effects in force microscopy

Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by...

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Veröffentlicht in:	Journal of applied physics 1990-06, Vol.67 (12), p.7278-7280
Hauptverfasser:	SCHONENBERGER, C, ALVARADO, S. F, LAMBERT, S. E, SANDERS, I. L
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.
ISSN:	0021-8979 1089-7550
DOI:	10.1063/1.344511