Reliable single-target sputtering process for high-temperature superconducting films and devices

We report a simple, single-target magnetron sputtering process for films of high-temperature superconductors involving an off-axis sputtering geometry. The process lends itself both to film growth with high-temperature post-anneals and to low-temperature in situ film growth. The post-anneal process...

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Veröffentlicht in:Appl. Phys. Lett.; (United States) 1988-08, Vol.53 (5), p.444-446
Hauptverfasser: SANDSTROM, R. L, GALLAGHER, W. J, DINGER, T. R, KOCH, R. H, LAIBOWITZ, R. B, KLEINSASSER, A. W, GAMBINO, R. J, BUMBLE, B, CHISHOLM, M. F
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Sprache:eng
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Zusammenfassung:We report a simple, single-target magnetron sputtering process for films of high-temperature superconductors involving an off-axis sputtering geometry. The process lends itself both to film growth with high-temperature post-anneals and to low-temperature in situ film growth. The post-anneal process routinely yields YBa2Cu3O7−x films on SrTiO3 substrates that are fully superconducting at 86–89 K. Current densities at 77 K range from 104 to 8×105 A/cm2. A single-level superconducting quantum interference device (dc SQUID), made by photolithographically patterning a low current density film, has a flux noise level at 77 K of 3×10−4 Φ0/(Hz)1/2 at 20 Hz, dominated by low-frequency noise associated with flux motion in the film.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.100615