Rapid electron beam reacted tantalum/titanium bilayers on silicon

The electrical and structural characteristics of tantalum-titanium bilayers on silicon reacted by electron beam heating have been investigated over a wide range of temperature and time conditions. The reacted layers exhibit low sheet resistance and stable electrical characteristics up to at least 11...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics 1988-12, Vol.27 (12), p.2333-2339
Hauptverfasser: RAMAN, V. K, MAHMOOD, F, MCMAHON, R. A, AHMED, H, JEYNES, C
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The electrical and structural characteristics of tantalum-titanium bilayers on silicon reacted by electron beam heating have been investigated over a wide range of temperature and time conditions. The reacted layers exhibit low sheet resistance and stable electrical characteristics up to at least 1100degC. Titanium starts reacting from 750degC onwards for 100 milliseconds reaction times whereas tantalum starts reacting only above 900degC for such short reaction times. RBS results confirm that silicon is the major diffusing species and there is no evidence for the formation of ternary silicides. Reactions have also been explored on millisecond time scales by non-isothermal heating.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.27.2333