Probing of basal planes of MoS2 by scanning tunneling microscopy

Probing of basal planes of MoS2 by scanning tunneling microscopy

Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the den...

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Veröffentlicht in:Applied physics letters 1988-06, Vol.52 (26), p.2252-2254
Hauptverfasser: SARID, D, HENSON, T. D, ARMSTRONG, N. R, BELL, L. S
Format: Artikel
Sprache:eng
Schlagworte:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Physics
Surface and interface electron states
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Zusammenfassung:Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.99769