Application of ultra-soft X-ray emission spectroscopy for solid surfaces studies
The capabilities of ultra-soft X-ray emission spectroscopy with electron energy variation for the non-destructive depth scanning of chemical bonding and atomic composition in the surface region of solids (e.g. Al--2Mg) are analyzed. Examples of application of the method for various systems and compa...
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| Veröffentlicht in: | Crystal research and technology (1979) 1988-06, Vol.23 (6), p.835-838 |
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| container_issue | 6 |
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| container_title | Crystal research and technology (1979) |
| container_volume | 23 |
| creator | Shulakov, A. S. |
| description | The capabilities of ultra-soft X-ray emission spectroscopy with electron energy variation for the non-destructive depth scanning of chemical bonding and atomic composition in the surface region of solids (e.g. Al--2Mg) are analyzed. Examples of application of the method for various systems and comparison with Auger profiling results are given. 4 ref.--AA(UK/US). |
| doi_str_mv | 10.1002/crat.2170230623 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0232-1300 |
| ispartof | Crystal research and technology (1979), 1988-06, Vol.23 (6), p.835-838 |
| issn | 0232-1300 1521-4079 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_24949156 |
| source | Wiley Online Library Journals Frontfile Complete |
| title | Application of ultra-soft X-ray emission spectroscopy for solid surfaces studies |
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