Application of ultra-soft X-ray emission spectroscopy for solid surfaces studies
The capabilities of ultra-soft X-ray emission spectroscopy with electron energy variation for the non-destructive depth scanning of chemical bonding and atomic composition in the surface region of solids (e.g. Al--2Mg) are analyzed. Examples of application of the method for various systems and compa...
Gespeichert in:
| Veröffentlicht in: | Crystal research and technology (1979) 1988-06, Vol.23 (6), p.835-838 |
|---|---|
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | The capabilities of ultra-soft X-ray emission spectroscopy with electron energy variation for the non-destructive depth scanning of chemical bonding and atomic composition in the surface region of solids (e.g. Al--2Mg) are analyzed. Examples of application of the method for various systems and comparison with Auger profiling results are given. 4 ref.--AA(UK/US). |
|---|---|
| ISSN: | 0232-1300 1521-4079 |
| DOI: | 10.1002/crat.2170230623 |