Determination of combinational logic circuit reliability through generation of fault diagnosis tests

This paper investigates the relationships between a given set of excitation vectors and the test sets for faults occuring in combinational circuits, in order to obtain new conditions for determining the redundant cubes of terminal states. The analysis presented is concluded with two new algorithms f...

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Veröffentlicht in:	Microelectronics and reliability 1988, Vol.28 (4), p.541-545
Hauptverfasser:	Dokouzgiannis, S.P., Kontoleon, J.M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	This paper investigates the relationships between a given set of excitation vectors and the test sets for faults occuring in combinational circuits, in order to obtain new conditions for determining the redundant cubes of terminal states. The analysis presented is concluded with two new algorithms for the evaluation of combinational logic circuit reliability.
ISSN:	0026-2714 1872-941X
DOI:	10.1016/0026-2714(88)90138-2