Identification of platinum phases on γ-alumina by XPS

Analysis of Pt supported on alumina by XPS is complicated by overlapping Al2p and Pt4f lines. The interference problem is eliminated when the Pt4d 5 2 lines are used instead. Although these lines are relatively broad, they can be used to discriminate between particulate and dispersed phase Pt on alu...

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Veröffentlicht in:	Applied surface science 1988-06, Vol.32 (1), p.246-252
Hauptverfasser:	Shyu, J.Z., Otto, K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Catalysis Catalysts: preparations and properties Catalytic reactions Chemistry Exact sciences and technology General and physical chemistry General. Nomenclature, chemical documentation, computer chemistry Theory of reactions, general kinetics Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry
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Zusammenfassung:	Analysis of Pt supported on alumina by XPS is complicated by overlapping Al2p and Pt4f lines. The interference problem is eliminated when the Pt4d 5 2 lines are used instead. Although these lines are relatively broad, they can be used to discriminate between particulate and dispersed phase Pt on alumina. The discrimination is based on the Pt binding energy measured after an oxidized sample has been exposed to hydrogen at 150°C. Within the limitation of XPS sampling depth, this method is useful in studying sintering and redispersion of Pt on alumina.
ISSN:	0169-4332 1873-5584
DOI:	10.1016/0169-4332(88)90085-2