The frequency response of the effective resistance of thin chromium and tin films

A study was made of the frequency response of the effective resistance of a high resistivity Cr film 5-60 nm thick and a low resistivity Sn film 30-100 nm thick. The structure of the films is described and an equation for the frequency response is discussed. The variation of resistance against log f...

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Veröffentlicht in:Journal of materials science letters 1985-10, Vol.4 (10), p.1213-1216
Hauptverfasser: ANGADI, M. A, UDACHAN, L. A
Format: Artikel
Sprache:eng
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Zusammenfassung:A study was made of the frequency response of the effective resistance of a high resistivity Cr film 5-60 nm thick and a low resistivity Sn film 30-100 nm thick. The structure of the films is described and an equation for the frequency response is discussed. The variation of resistance against log f is plotted for various thicknesses. For lower thickness films the d.c. resistivity falls suddenly but for greater thicknesses the resistivity increases gradually. A mathematical model proposed for the frequency response was valid for the discontinuous films like Cr but could not be used for semi-continuous films like Sn. 25 ref.--H.B.C.
ISSN:0261-8028
1573-4811
DOI:10.1007/BF00723461