Lateral photodetectors on semi-insulating InGaAs and InP
A new type of high-performance lateral PIN photodector has been formed by alloying p-type and n-type metallic contacts onto semi-insulating InGaAs or InP without a separate junction fabrication step. Low dark current (
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Veröffentlicht in: | Applied physics letters 1985-01, Vol.46 (2), p.157-158 |
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creator | DIADIUK, V GROVES, S. H |
description | A new type of high-performance lateral PIN photodector has been formed by alloying p-type and n-type metallic contacts onto semi-insulating InGaAs or InP without a separate junction fabrication step. Low dark current ( |
doi_str_mv | 10.1063/1.95720 |
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H</creator><creatorcontrib>DIADIUK, V ; GROVES, S. H</creatorcontrib><description>A new type of high-performance lateral PIN photodector has been formed by alloying p-type and n-type metallic contacts onto semi-insulating InGaAs or InP without a separate junction fabrication step. Low dark current (<1 nA), high external quantum efficiency (40% at λ=1.24 μm, without antireflection coating), and high speed (full width at half-maximum <50 ps) have been obtained with reverse bias of 10 V. These characteristics, plus the simplicity of fabrication and the planar lateral configuration, make these devices attractive for monolithic integration with field-effect transistors and for photodetector arrays.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.95720</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Applied sciences ; Exact sciences and technology ; Systems, networks and services of telecommunications ; Telecommunications ; Telecommunications and information theory ; Transmission and modulation (techniques and equipments)</subject><ispartof>Applied physics letters, 1985-01, Vol.46 (2), p.157-158</ispartof><rights>1986 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-7fe472df74397a2240018d854d740f05167152385e7cbc7c9b90701367f5f77b3</citedby><cites>FETCH-LOGICAL-c349t-7fe472df74397a2240018d854d740f05167152385e7cbc7c9b90701367f5f77b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8478798$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>DIADIUK, V</creatorcontrib><creatorcontrib>GROVES, S. H</creatorcontrib><title>Lateral photodetectors on semi-insulating InGaAs and InP</title><title>Applied physics letters</title><description>A new type of high-performance lateral PIN photodector has been formed by alloying p-type and n-type metallic contacts onto semi-insulating InGaAs or InP without a separate junction fabrication step. Low dark current (<1 nA), high external quantum efficiency (40% at λ=1.24 μm, without antireflection coating), and high speed (full width at half-maximum <50 ps) have been obtained with reverse bias of 10 V. These characteristics, plus the simplicity of fabrication and the planar lateral configuration, make these devices attractive for monolithic integration with field-effect transistors and for photodetector arrays.</description><subject>Applied sciences</subject><subject>Exact sciences and technology</subject><subject>Systems, networks and services of telecommunications</subject><subject>Telecommunications</subject><subject>Telecommunications and information theory</subject><subject>Transmission and modulation (techniques and equipments)</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNo9kEFLAzEUhIMoWKv4F_YgetqabJJ9ybEUrYWCHvQc0myiK9uk5qUH_72rLZ5mBj6GYQi5ZnTGaMvv2UxLaOgJmTAKUHPG1CmZUEp53WrJzskF4ucYZcP5hKi1LT7bodp9pJI6X7wrKWOVYoV-29d9xP1gSx_fq1Vc2jlWNnajfbkkZ8EO6K-OOiVvjw-vi6d6_bxcLebr2nGhSw3BC2i6AIJrsE0jKGWqU1J0IGigkrXAxiVKenAbB05vNAXKeAtBBoANn5LbQ-8up6-9x2K2PTo_DDb6tEfTiFZwAWwE7w6gywkx-2B2ud_a_G0YNb_PGGb-nhnJm2OlRWeHkG10Pf7jSoACrfgPrINfZw</recordid><startdate>19850115</startdate><enddate>19850115</enddate><creator>DIADIUK, V</creator><creator>GROVES, S. 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H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-7fe472df74397a2240018d854d740f05167152385e7cbc7c9b90701367f5f77b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>Applied sciences</topic><topic>Exact sciences and technology</topic><topic>Systems, networks and services of telecommunications</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><topic>Transmission and modulation (techniques and equipments)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>DIADIUK, V</creatorcontrib><creatorcontrib>GROVES, S. H</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>DIADIUK, V</au><au>GROVES, S. H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Lateral photodetectors on semi-insulating InGaAs and InP</atitle><jtitle>Applied physics letters</jtitle><date>1985-01-15</date><risdate>1985</risdate><volume>46</volume><issue>2</issue><spage>157</spage><epage>158</epage><pages>157-158</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>A new type of high-performance lateral PIN photodector has been formed by alloying p-type and n-type metallic contacts onto semi-insulating InGaAs or InP without a separate junction fabrication step. Low dark current (<1 nA), high external quantum efficiency (40% at λ=1.24 μm, without antireflection coating), and high speed (full width at half-maximum <50 ps) have been obtained with reverse bias of 10 V. These characteristics, plus the simplicity of fabrication and the planar lateral configuration, make these devices attractive for monolithic integration with field-effect transistors and for photodetector arrays.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.95720</doi><tpages>2</tpages></addata></record> |
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subjects | Applied sciences Exact sciences and technology Systems, networks and services of telecommunications Telecommunications Telecommunications and information theory Transmission and modulation (techniques and equipments) |
title | Lateral photodetectors on semi-insulating InGaAs and InP |
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