Hole-mediated chemisorption of atomic hydrogen in silicon
It has been shown that at 120 °C atomic hydrogen diffuses into p-type silicon where it ties to a Si dangling bond near an acceptor. However, a thin n-type surface layer blocks the entry of atomic hydrogen. This demonstrates that free holes in the surface layer are needed to permit the entry of atomi...
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Veröffentlicht in: | Applied physics letters 1985-01, Vol.47 (7), p.748-750 |
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creator | PANKOVE, J. I MAGEE, C. W WANCE, R. O |
description | It has been shown that at 120 °C atomic hydrogen diffuses into p-type silicon where it ties to a Si dangling bond near an acceptor. However, a thin n-type surface layer blocks the entry of atomic hydrogen. This demonstrates that free holes in the surface layer are needed to permit the entry of atomic hydrogen. |
doi_str_mv | 10.1063/1.96026 |
format | Article |
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I</creatorcontrib><creatorcontrib>MAGEE, C. W</creatorcontrib><creatorcontrib>WANCE, R. O</creatorcontrib><title>Hole-mediated chemisorption of atomic hydrogen in silicon</title><title>Applied physics letters</title><description>It has been shown that at 120 °C atomic hydrogen diffuses into p-type silicon where it ties to a Si dangling bond near an acceptor. However, a thin n-type surface layer blocks the entry of atomic hydrogen. This demonstrates that free holes in the surface layer are needed to permit the entry of atomic hydrogen.</description><subject>Applied sciences</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Diffusion in solids</subject><subject>Diffusion of impurities</subject><subject>Exact sciences and technology</subject><subject>Other techniques and industries</subject><subject>Physics</subject><subject>Transport properties of condensed matter (nonelectronic)</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNqF0E1LAzEQBuAgCtYq_oU9iJ62JpuPTY5S1AoFL3oO2WRiI7ubmmwP_fdGW7x6GoZ5eBlehK4JXhAs6D1ZKIEbcYJmBLdtTQmRp2iGMaa1UJyco4ucP8vKG0pnSK1iD_UALpgJXGU3MIQc03YKcayir8wUh2Crzd6l-AFjFcYqhz7YOF6iM2_6DFfHOUfvT49vy1W9fn1-WT6sa0slnmrrnOGsBc4712EARgizhtvG83JyhHkrFQgvGOs4J8pSTzuQlkmQTccZnaPbQ-42xa8d5EmXDy30vRkh7rJumGg4JqrAuwO0KeacwOttCoNJe02w_qlGE_1bTZE3x0iTrel9MqMN-Y_LVrWK0f9YUZyWtG8cbG87</recordid><startdate>19850101</startdate><enddate>19850101</enddate><creator>PANKOVE, J. 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O</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Hole-mediated chemisorption of atomic hydrogen in silicon</atitle><jtitle>Applied physics letters</jtitle><date>1985-01-01</date><risdate>1985</risdate><volume>47</volume><issue>7</issue><spage>748</spage><epage>750</epage><pages>748-750</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>It has been shown that at 120 °C atomic hydrogen diffuses into p-type silicon where it ties to a Si dangling bond near an acceptor. However, a thin n-type surface layer blocks the entry of atomic hydrogen. This demonstrates that free holes in the surface layer are needed to permit the entry of atomic hydrogen.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.96026</doi><tpages>3</tpages></addata></record> |
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subjects | Applied sciences Condensed matter: structure, mechanical and thermal properties Diffusion in solids Diffusion of impurities Exact sciences and technology Other techniques and industries Physics Transport properties of condensed matter (nonelectronic) |
title | Hole-mediated chemisorption of atomic hydrogen in silicon |
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