Electron mobility limits of two-dimensional electron gas in N-AlGaAs/GaAs at low temperature
Using the warm electron coefficient, the electron mobility, μinel, limited only by inelastic scattering was studied for two-dimensional electron gas confined to the GaAs side of an N-AlGaAs/GaAs heterojunction. The warm electron coefficient β was measured to be 0.1–3×10−3 cm2/V2 at the temperature 4...
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Veröffentlicht in: | Journal of applied physics 1985-06, Vol.57 (12), p.5354-5358 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Using the warm electron coefficient, the electron mobility, μinel, limited only by inelastic scattering was studied for two-dimensional electron gas confined to the GaAs side of an N-AlGaAs/GaAs heterojunction. The warm electron coefficient β was measured to be 0.1–3×10−3 cm2/V2 at the temperature 4.2–30 K. The electron mobility μinel is interpreted as the upper limit obtained in the condition free of ionized impurity scattering. The relation between β and electron mobility μinel for two-dimensional electron gas is obtained as β∝μinel, when ionized impurity scattering is predominant. Combining the theoretical relations and experimental results, the electron mobility limit of a two-dimensional electron gas at 4.2 K is found to be about 9.0×106 cm2/V sec at sheet electron concentration of 8×1010 cm−2. The exponent of its temperature dependence is −1.28. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.334855 |