Improved age-diffusion model for low-energy electron transport in solids. II: Application to secondary emission from aluminum

The "improved age-diffusion" model for secondary-electron transport is applied to Al. Electron cross sections for inelastic collisions with the free-electron gas, using the Lindhard dielectric function, and for elastic collisions with the randomly distributed ionic cores are used in the calculations. The most important characteristics of backward secondary-electron emission induced by low-energy electrons on polycrystalline Al targets are calculated and compared to experimental results and to Monte Carlo calculations. The model appears to predict the electronic yield, the energy spectra, and the spatial dependence of secondary emission with reasonable accuracy. 27 ref.--AA(US).