Microcleavage transmission electron microscopy applied to the interfacial structure of multilayers and microstructure of small particles on a substrate

We have developed a new technique useful in imaging microstructures such as small particles, multilayers, and superlattices on a substrate. By producing images at various angles with respect to the substrate we have been able to obtain new information on interfacial structure not yet available with...

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Veröffentlicht in:	Appl. Phys. Lett.; (United States) 1987-05, Vol.50 (21), p.1480-1481
Hauptverfasser:	LEPETRE, Y, ZIEGLER, E, SCHULLER, I. K
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology CRYSTAL STRUCTURE ELECTRON MICROSCOPY Exact sciences and technology INTERFACES LAYERS Materials science MEASURING METHODS Metals, semimetals and alloys MICROSCOPY 440300 > Miscellaneous Instruments-- (-1989) MICROSTRUCTURE OTHER INSTRUMENTATION Physics Specific materials SUPERLATTICES SURFACES Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology TRANSMISSION ELECTRON MICROSCOPY
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Beschreibung
Zusammenfassung:	We have developed a new technique useful in imaging microstructures such as small particles, multilayers, and superlattices on a substrate. By producing images at various angles with respect to the substrate we have been able to obtain new information on interfacial structure not yet available with other techniques.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.97806