Nanowire facilitated transfer of sensitive TEM samples in a FIB

•A fast and facile nanowire-facilitated method for sensitive TEM sample transfer.•Applicable for the transfer of thin films and various mechanically (and beam) sensitive samples.•In particular, the method is suitable for in situ TEM sample preparation.•Results in significant reduction of sample bend...

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Veröffentlicht in:	Ultramicroscopy 2020-12, Vol.219, p.113075-113075, Article 113075
Hauptverfasser:	Gorji, Saleh, Kashiwar, Ankush, Mantha, Lakshmi S., Kruk, Robert, Witte, Ralf, Marek, Peter, Hahn, Horst, Kübel, Christian, Scherer, Torsten
Format:	Artikel
Sprache:	eng
Schlagworte:	FeRh Focused ion beam Lamellae lift-out Nanomanipulator TEM sample preparation Thin film transfer
Online-Zugang:	Volltext
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