Development of fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy in the soft x-ray region for time-resolved experiments

A fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy technique in the soft x-ray region, by which the x-ray absorption spectra are recorded without scanning the monochromator, has been developed. The wavelength-dispersed soft x rays, in which the wavelength (photon energy) contin...

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Veröffentlicht in:Review of scientific instruments 2020-09, Vol.91 (9), p.093104-093104
Hauptverfasser: Amemiya, K., Sakata, K., Suzuki-Sakamaki, M.
Format: Artikel
Sprache:eng
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Zusammenfassung:A fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy technique in the soft x-ray region, by which the x-ray absorption spectra are recorded without scanning the monochromator, has been developed. The wavelength-dispersed soft x rays, in which the wavelength (photon energy) continuously changes as a function of the position, illuminate the sample, and the emitted fluorescence soft x rays at each position are separately focused by an imaging optics onto each position at a soft x-ray detector. Ni L-edge x-ray absorption spectra for Ni and NiO thin films taken in the wavelength-dispersive mode are shown in order to demonstrate the validity of the technique. The development of the technique paves the way for a real-time observation of time-dependent processes, such as surface chemical reactions, with much higher gas pressure compared to the electron-yield mode, as well as under magnetic and electric fields.
ISSN:0034-6748
1089-7623
DOI:10.1063/5.0021981