Structure-property relationships in Cr/Cu and Ti/Ni microlaminate composites
Cr/Cu and Ti/Ni microlaminate composites were deposited as full density sheets from two electron beam evaporation sources. The deposits were characterized by X-ray diffraction, optical microscopy and scanning electron microscopy. Microhardness and tensile properties were measured at room and elevate...
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Veröffentlicht in: | Thin solid films 1984-02, Vol.112 (3), p.227-236 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Cr/Cu and Ti/Ni microlaminate composites were deposited as full density sheets from two electron beam evaporation sources. The deposits were characterized by X-ray diffraction, optical microscopy and scanning electron microscopy. Microhardness and tensile properties were measured at room and elevated temperatures as a function of lamina thickness. The strength increased markedly in the range of lamina thickness below 10 μm. The specimens showed brittle behavior at room temperature but exhibited some ductility in elevated temperature tests. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/0040-6090(84)90213-X |