XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid
XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH) 4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems t...
Gespeichert in:
| Veröffentlicht in: | Electrochimica acta 1986-04, Vol.31 (4), p.477-479 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 479 |
|---|---|
| container_issue | 4 |
| container_start_page | 477 |
| container_title | Electrochimica acta |
| container_volume | 31 |
| creator | Rach, E. Heitbaum, J. |
| description | XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH)
4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems to be Pt(OH)
4 on the basis of difference spectra obtained. |
| doi_str_mv | 10.1016/0013-4686(86)80112-8 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_24366055</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0013468686801128</els_id><sourcerecordid>24366055</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-85c85aca9f513e9e6019ca966c30a69206d851bc1f991af432616e977b08df423</originalsourceid><addsrcrecordid>eNp9kE9LxDAQxYMouK5-Aw85iOihmjTtNL0IsvgPFlxQwVvIphOMdJs1acX66W3ZZY_CwDDD771hHiGnnF1xxuGaMS6SDCRcSLiUjPM0kXtkwmUhEiHzcp9MdsghOYrxkzFWQMEmZP6-eKG60XUfXaTe0vYDqf9xFdJa9xio9WGFFfUNXbR02Q-sr9yvbt2wcQ2NXW274AzVxlXH5MDqOuLJtk_J2_3d6-wxmT8_PM1u54kRkLWJzI3MtdGlzbnAEoHxcpgAjGAaypRBJXO-NNyWJdc2EylwwLIolkxWNkvFlJxvfNfBf3UYW7Vy0WBd6wZ9F1WaCQCW5wOYbUATfIwBrVoHt9KhV5ypMTo15qLGXNRYY3RKDrKzrb-ORtc26Ma4uNMWMgfI-IDdbDAcfv12GFQ0DhuDlQtoWlV59_-dP1tJgLs</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24366055</pqid></control><display><type>article</type><title>XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid</title><source>Access via ScienceDirect (Elsevier)</source><creator>Rach, E. ; Heitbaum, J.</creator><creatorcontrib>Rach, E. ; Heitbaum, J.</creatorcontrib><description>XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH)
4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems to be Pt(OH)
4 on the basis of difference spectra obtained.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/0013-4686(86)80112-8</identifier><identifier>CODEN: ELCAAV</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Chemistry ; Electrochemistry ; Exact sciences and technology ; General and physical chemistry ; Kinetics and mechanism of reactions</subject><ispartof>Electrochimica acta, 1986-04, Vol.31 (4), p.477-479</ispartof><rights>1986</rights><rights>1987 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-85c85aca9f513e9e6019ca966c30a69206d851bc1f991af432616e977b08df423</citedby><cites>FETCH-LOGICAL-c364t-85c85aca9f513e9e6019ca966c30a69206d851bc1f991af432616e977b08df423</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/0013-4686(86)80112-8$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7856641$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Rach, E.</creatorcontrib><creatorcontrib>Heitbaum, J.</creatorcontrib><title>XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid</title><title>Electrochimica acta</title><description>XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH)
4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems to be Pt(OH)
4 on the basis of difference spectra obtained.</description><subject>Chemistry</subject><subject>Electrochemistry</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Kinetics and mechanism of reactions</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1986</creationdate><recordtype>article</recordtype><recordid>eNp9kE9LxDAQxYMouK5-Aw85iOihmjTtNL0IsvgPFlxQwVvIphOMdJs1acX66W3ZZY_CwDDD771hHiGnnF1xxuGaMS6SDCRcSLiUjPM0kXtkwmUhEiHzcp9MdsghOYrxkzFWQMEmZP6-eKG60XUfXaTe0vYDqf9xFdJa9xio9WGFFfUNXbR02Q-sr9yvbt2wcQ2NXW274AzVxlXH5MDqOuLJtk_J2_3d6-wxmT8_PM1u54kRkLWJzI3MtdGlzbnAEoHxcpgAjGAaypRBJXO-NNyWJdc2EylwwLIolkxWNkvFlJxvfNfBf3UYW7Vy0WBd6wZ9F1WaCQCW5wOYbUATfIwBrVoHt9KhV5ypMTo15qLGXNRYY3RKDrKzrb-ORtc26Ma4uNMWMgfI-IDdbDAcfv12GFQ0DhuDlQtoWlV59_-dP1tJgLs</recordid><startdate>19860401</startdate><enddate>19860401</enddate><creator>Rach, E.</creator><creator>Heitbaum, J.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>19860401</creationdate><title>XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid</title><author>Rach, E. ; Heitbaum, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-85c85aca9f513e9e6019ca966c30a69206d851bc1f991af432616e977b08df423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1986</creationdate><topic>Chemistry</topic><topic>Electrochemistry</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Kinetics and mechanism of reactions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rach, E.</creatorcontrib><creatorcontrib>Heitbaum, J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rach, E.</au><au>Heitbaum, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid</atitle><jtitle>Electrochimica acta</jtitle><date>1986-04-01</date><risdate>1986</risdate><volume>31</volume><issue>4</issue><spage>477</spage><epage>479</epage><pages>477-479</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><coden>ELCAAV</coden><abstract>XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH)
4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems to be Pt(OH)
4 on the basis of difference spectra obtained.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/0013-4686(86)80112-8</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0013-4686 |
| ispartof | Electrochimica acta, 1986-04, Vol.31 (4), p.477-479 |
| issn | 0013-4686 1873-3859 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_24366055 |
| source | Access via ScienceDirect (Elsevier) |
| subjects | Chemistry Electrochemistry Exact sciences and technology General and physical chemistry Kinetics and mechanism of reactions |
| title | XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T01%3A03%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=XPS%20analysis%20of%20the%20oxide%20layer%20formed%20on%20Pt%20by%20anodization%20in%20sulfuric%20acid&rft.jtitle=Electrochimica%20acta&rft.au=Rach,%20E.&rft.date=1986-04-01&rft.volume=31&rft.issue=4&rft.spage=477&rft.epage=479&rft.pages=477-479&rft.issn=0013-4686&rft.eissn=1873-3859&rft.coden=ELCAAV&rft_id=info:doi/10.1016/0013-4686(86)80112-8&rft_dat=%3Cproquest_cross%3E24366055%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=24366055&rft_id=info:pmid/&rft_els_id=0013468686801128&rfr_iscdi=true |