XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid

XPS analysis of the oxide layer formed on Pt by anodization in sulfuric acid

XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH) 4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems t...

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Veröffentlicht in:Electrochimica acta 1986-04, Vol.31 (4), p.477-479
Hauptverfasser: Rach, E., Heitbaum, J.
Format: Artikel
Sprache:eng
Schlagworte:
Chemistry
Electrochemistry
Exact sciences and technology
General and physical chemistry
Kinetics and mechanism of reactions
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Zusammenfassung:XPS analysis of the oxide layer formed on Pt electrodes in sulfuric acid has been performed. Thick layers grown within 15 h at 2.3 V are characterized as Pt(OH) 4 in accordance with literature data. Thinner layers obtained at potentials ⩽ 1.5 V consist of one surface species only, which also seems to be Pt(OH) 4 on the basis of difference spectra obtained.
ISSN:0013-4686
1873-3859
DOI:10.1016/0013-4686(86)80112-8