Growth of vanadium-doped semi-insulating GaAs by MOCVD
Semi-insulating GaAs layers have been grown by MOCVD by vanadium (V) doping with triethoxylvanadyl: VO(OC 2H 5) 3. The resulting resistivity was 10 8 Ω cm or more at room temperature. The maximum deep level concentration found was more than 10 18 cm -3 without surface roughening. Semi-insulating lay...
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Veröffentlicht in: | Journal of crystal growth 1984-09, Vol.68 (1), p.39-43 |
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container_issue | 1 |
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container_title | Journal of crystal growth |
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creator | Akiyama, Masahiro Kawarada, Yoshihiro Kaminishi, Katsuzo |
description | Semi-insulating GaAs layers have been grown by MOCVD by vanadium (V) doping with triethoxylvanadyl: VO(OC
2H
5)
3. The resulting resistivity was 10
8
Ω cm or more at room temperature. The maximum deep level concentration found was more than 10
18 cm
-3 without surface roughening. Semi-insulating layers were obtained over a wide range of growth conditions and were obtained over a wide range of growth conditions and were relatively stable to high temperature treatment. Furthermore, this dopant did not show a memory effect. |
doi_str_mv | 10.1016/0022-0248(84)90394-4 |
format | Article |
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2H
5)
3. The resulting resistivity was 10
8
Ω cm or more at room temperature. The maximum deep level concentration found was more than 10
18 cm
-3 without surface roughening. Semi-insulating layers were obtained over a wide range of growth conditions and were obtained over a wide range of growth conditions and were relatively stable to high temperature treatment. Furthermore, this dopant did not show a memory effect.</description><identifier>ISSN: 0022-0248</identifier><identifier>EISSN: 1873-5002</identifier><identifier>DOI: 10.1016/0022-0248(84)90394-4</identifier><language>eng</language><publisher>Elsevier B.V</publisher><ispartof>Journal of crystal growth, 1984-09, Vol.68 (1), p.39-43</ispartof><rights>1984</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c335t-3af42839a3131acc8de352fa2241307fb6d4d7e9509a4071c682e128a31710c43</citedby><cites>FETCH-LOGICAL-c335t-3af42839a3131acc8de352fa2241307fb6d4d7e9509a4071c682e128a31710c43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0022024884903944$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,65309</link.rule.ids></links><search><creatorcontrib>Akiyama, Masahiro</creatorcontrib><creatorcontrib>Kawarada, Yoshihiro</creatorcontrib><creatorcontrib>Kaminishi, Katsuzo</creatorcontrib><title>Growth of vanadium-doped semi-insulating GaAs by MOCVD</title><title>Journal of crystal growth</title><description>Semi-insulating GaAs layers have been grown by MOCVD by vanadium (V) doping with triethoxylvanadyl: VO(OC
2H
5)
3. The resulting resistivity was 10
8
Ω cm or more at room temperature. The maximum deep level concentration found was more than 10
18 cm
-3 without surface roughening. Semi-insulating layers were obtained over a wide range of growth conditions and were obtained over a wide range of growth conditions and were relatively stable to high temperature treatment. Furthermore, this dopant did not show a memory effect.</description><issn>0022-0248</issn><issn>1873-5002</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1984</creationdate><recordtype>article</recordtype><recordid>eNp9kDtPwzAUhS0EEqXwDxgyIRgM148kzoKEChSkoi7Aarn2DRjlUeykqP-ehCJGpjuc7xzpfoScMrhkwLIrAM4pcKnOlbwoQBSSyj0yYSoXNB3CfTL5Qw7JUYwfAEOPwYRk89B-de9JWyYb0xjn-5q6do0uiVh76pvYV6bzzVsyNzcxWW2Tp-Xs9faYHJSminjye6fk5f7uefZAF8v54-xmQa0QaUeFKSVXojCCCWasVQ5FykvDuWQC8nKVOelyLFIojISc2UxxZFwNfM7ASjElZ7vddWg_e4ydrn20WFWmwbaPmkvOc5mxAZQ70IY2xoClXgdfm7DVDPQoSY8G9GhAK6l_JOlx_3pXw-GJjcego_XYWHQ-oO20a_3_A99GuGs1</recordid><startdate>19840901</startdate><enddate>19840901</enddate><creator>Akiyama, Masahiro</creator><creator>Kawarada, Yoshihiro</creator><creator>Kaminishi, Katsuzo</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19840901</creationdate><title>Growth of vanadium-doped semi-insulating GaAs by MOCVD</title><author>Akiyama, Masahiro ; Kawarada, Yoshihiro ; Kaminishi, Katsuzo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c335t-3af42839a3131acc8de352fa2241307fb6d4d7e9509a4071c682e128a31710c43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1984</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Akiyama, Masahiro</creatorcontrib><creatorcontrib>Kawarada, Yoshihiro</creatorcontrib><creatorcontrib>Kaminishi, Katsuzo</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of crystal growth</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Akiyama, Masahiro</au><au>Kawarada, Yoshihiro</au><au>Kaminishi, Katsuzo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth of vanadium-doped semi-insulating GaAs by MOCVD</atitle><jtitle>Journal of crystal growth</jtitle><date>1984-09-01</date><risdate>1984</risdate><volume>68</volume><issue>1</issue><spage>39</spage><epage>43</epage><pages>39-43</pages><issn>0022-0248</issn><eissn>1873-5002</eissn><abstract>Semi-insulating GaAs layers have been grown by MOCVD by vanadium (V) doping with triethoxylvanadyl: VO(OC
2H
5)
3. The resulting resistivity was 10
8
Ω cm or more at room temperature. The maximum deep level concentration found was more than 10
18 cm
-3 without surface roughening. Semi-insulating layers were obtained over a wide range of growth conditions and were obtained over a wide range of growth conditions and were relatively stable to high temperature treatment. Furthermore, this dopant did not show a memory effect.</abstract><pub>Elsevier B.V</pub><doi>10.1016/0022-0248(84)90394-4</doi><tpages>5</tpages></addata></record> |
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title | Growth of vanadium-doped semi-insulating GaAs by MOCVD |
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