The effects of annealing on the structure and composition of electron-beam-evaporated tin oxide films
Electron-beam-evaporated films of tin oxide are amorphous with compositions between SnO and SnO 2. Devitrification of the film in an isochronal anneal (24h) begins to occur at about 350°C with the formation of crystalline SnO. At a higher annealing temperature (about 600°C) the amorphous film transf...
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| Veröffentlicht in: | Thin solid films 1984-01, Vol.122 (3), p.231-241 |
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| container_title | Thin solid films |
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| creator | Choudhury, N.S. Goehner, R.P. Lewis, N. Green, R.W. |
| description | Electron-beam-evaporated films of tin oxide are amorphous with compositions between SnO and SnO
2. Devitrification of the film in an isochronal anneal (24h) begins to occur at about 350°C with the formation of crystalline SnO. At a higher annealing temperature (about 600°C) the amorphous film transforms to SnO
2 and metallic tin. |
| doi_str_mv | 10.1016/0040-6090(84)90050-6 |
| format | Article |
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| issn | 0040-6090 1879-2731 |
| language | eng |
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| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
| title | The effects of annealing on the structure and composition of electron-beam-evaporated tin oxide films |
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