Colloid-SEM method for the investigation of magnetic domain structures

•The technique for observing magnetic domains using SEM and dried Bitter patterns is optimized. SEM-colloid method has good surface sensitivity, moderate spatial resolution and easy sample preparation.•Examples of visualization of the domain structure of ferromagnets (polycrystalline, single crystal samples and thin films) in the regimes of secondary and reflected electrons are given.•The possibility of observing magnetic domains on chips and unpolished surfaces of samples has been demonstrated. The paper presents scanning electron microscopy (SEM) studies on the magnetic domain structure (DS) using magnetic colloid. The possibility of colloid-SEM method for observing the DS of mono- and polycrystalline samples in the secondary (SEI) and backscattered electrons modes (BEC) is demonstrated. Owing to the large focal depth of SEM, it is possible to observe the overall DS and fine features, even in unpollished samples.