Observation of anisotropic internal stresses by electroreflectance and transverse photovoltaic effect measurements

Observation of transverse photovoltaic effect (TPE) along the electroreflectance (ER) effect on etched and mechanically polished surfaces is made. Measurements are made of t = 300k on 45 Omega cm p-type Ge with the orientation corresponding to the max. anisotropy of the electron mobility. The ER spe...

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Veröffentlicht in:	Physica status solidi. A, Applied research Applied research, 1984-05, Vol.83 (1), p.K31-K33
Hauptverfasser:	Evstigneev, A. M., Linnik, L. F., Linnik, L. G., Salkov, E. A., Krasiko, A. N., Snitko, O. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electrooptical effects Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics
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Beschreibung
Zusammenfassung:	Observation of transverse photovoltaic effect (TPE) along the electroreflectance (ER) effect on etched and mechanically polished surfaces is made. Measurements are made of t = 300k on 45 Omega cm p-type Ge with the orientation corresponding to the max. anisotropy of the electron mobility. The ER spectra are taken by the electrolyte method using linearly polarized light.--C.M.L.S.
ISSN:	0031-8965 1521-396X
DOI:	10.1002/pssa.2210830156