Aberration corrected spin polarized low energy electron microscope

•With aberration corrected LEEM and a high brightness spin polarized electron gun, high spatial resolution will provide more details for ultra-thin ferromagnetic film studies. This study reports the first realization of aberration corrected SPLEEM (AC-SPLEEM). The performance of the setup was tested...

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Veröffentlicht in:Ultramicroscopy 2020-09, Vol.216, p.113017-113017, Article 113017
Hauptverfasser: Yu, Lei, Wan, Weishi, Koshikawa, Takanori, Li, Meng, Yang, Xiaodong, Zheng, Changxi, Suzuki, Masahiko, Yasue, Tsuneo, Jin, Xiuguang, Takeda, Yoshikazu, Tromp, Ruud, Tang, Wen-Xin
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Sprache:eng
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Zusammenfassung:•With aberration corrected LEEM and a high brightness spin polarized electron gun, high spatial resolution will provide more details for ultra-thin ferromagnetic film studies. This study reports the first realization of aberration corrected SPLEEM (AC-SPLEEM). The performance of the setup was tested on ferromagnetic Fe nanoscale islands on a W(110) single crystal, with spatial resolution of 3.3 nm in spin asymmetry images. Spin Polarized Low Energy Electron Microscopy (SPLEEM) is a powerful tool to reveal the magnetic structure of ferromagnetic surfaces on the atomic depth scale level[1-3]. With aberration corrected LEEM and a high brightness spin polarized electron gun, high spatial resolution will provide more details for ultra-thin ferromagnetic film studies. This study reports the first realization of aberration corrected SPLEEM (AC-SPLEEM). The performance of the setup was tested on ferromagnetic Fe nanoscale islands on a W(110) single crystal, with spatial resolution of 3.3 nm in spin asymmetry images.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2020.113017