Low-frequency noise in low 1/f noise dc SQUID's

We demonstrate that the low-frequency noise in our edge junction dc superconducting quantum interference devices, with a basic 1/f flux noise of 2×10−12 Φ20/Hz at 1 Hz, can all be accounted for in terms of junction critical current fluctuations. A novel modulation readout scheme is able to cancel th...

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Veröffentlicht in:	Appl. Phys. Lett.; (United States) 1986-11, Vol.49 (20), p.1393-1395
Hauptverfasser:	FOGLIETTI, V, GALLAGHER, W. J, KETCHEN, M. B, KLEINSASSER, A. W, KOCH, R. H, RAIDER, S. I, SANDSTROM, R. L
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS CRITICAL CURRENT CURRENTS ELECTRIC CURRENTS ELECTRONIC EQUIPMENT Electronics Exact sciences and technology FLUXMETERS FREQUENCY DEPENDENCE JUNCTIONS MEASURING INSTRUMENTS MICROWAVE EQUIPMENT MODULATION NOISE Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SQUID DEVICES Superconducting devices SUPERCONDUCTING DEVICES 420201 > Engineering-- Cryogenic Equipment & Devices SUPERCONDUCTING JUNCTIONS
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Zusammenfassung:	We demonstrate that the low-frequency noise in our edge junction dc superconducting quantum interference devices, with a basic 1/f flux noise of 2×10−12 Φ20/Hz at 1 Hz, can all be accounted for in terms of junction critical current fluctuations. A novel modulation readout scheme is able to cancel the effect of junction critical current fluctuations and reduce our total noise to 1×10−12 Φ20/Hz at 0.1 Hz, a level that is three times lower than the lowest flux noise ever previously reported at this frequency.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.97334