Peak Force Infrared–Kelvin Probe Force Microscopy

Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared–Kelvin probe force microscopy (PFIR‐KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single‐pass scan. MAPbBr3 perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr3 near the boundary to PbBr2. PFIR‐KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR‐KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations. Force to be reckoned with: The correlations between nanoscale electrical, chemical, structural, and mechanical surface properties were explored in perovskite and amyloid fibrils with intrinsically integrated peak force infrared and Kelvin probe force microscopies. Correlative nanoimaging serves as a useful tool for deciphering the important underlying causal relationships between properties in situ.