Cross-sectioning of layered thin films by ultramicrotomy

Ultramicrotomy is shown to be a valuable technique for observing thin films in cross-section. The structure of layered Co-Tb and Mo-Ge films are characterized, with layers as thin as 0.9 nm resolved in the latter.

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Ultramicroscopy 1986, Vol.19 (1), p.69-73
Hauptverfasser:	Marshall, A.F., Dobbertin, D.C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Crystalline state (including molecular motions in solids) Exact sciences and technology Materials science Metals, semimetals and alloys Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other interactions of matter with particles and radiation Physics Specific materials Structure of solids and liquids crystallography
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Ultramicrotomy is shown to be a valuable technique for observing thin films in cross-section. The structure of layered Co-Tb and Mo-Ge films are characterized, with layers as thin as 0.9 nm resolved in the latter.
ISSN:	0304-3991 1879-2723
DOI:	10.1016/0304-3991(86)90008-2