EXAFS Study of Intermetallics of the Type RGe sub 2 (R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y). II. Determination of Ge--R Distances
The extended X-ray absorption fine structure (EXAFS) associated with the Ge K X-ray absorption discontinuity in pure Ge and in the intermetallics RGe sub 2 (R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y) has been studied. The Ge--R distances in these compounds have been determined by comparing th...
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Veröffentlicht in: | Pramāṇa 1985-06, Vol.24 (6), p.867-873 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The extended X-ray absorption fine structure (EXAFS) associated with the Ge K X-ray absorption discontinuity in pure Ge and in the intermetallics RGe sub 2 (R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y) has been studied. The Ge--R distances in these compounds have been determined by comparing the experimental phase shifts with the theoretical ones. The Ge--R distances in the compounds TbGe sub 2 , HoGe sub 2 and ErGe sub 2 are reported for the first time in this work. 12 ref.--AA |
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ISSN: | 0304-4289 |