EXAFS Study of Intermetallics of the Type RGe sub 2 (R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y). II. Determination of Ge--R Distances

The extended X-ray absorption fine structure (EXAFS) associated with the Ge K X-ray absorption discontinuity in pure Ge and in the intermetallics RGe sub 2 (R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y) has been studied. The Ge--R distances in these compounds have been determined by comparing th...

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Veröffentlicht in:Pramāṇa 1985-06, Vol.24 (6), p.867-873
Hauptverfasser: Chourasia, A R, Chafekar, V D, Mande, C
Format: Artikel
Sprache:eng
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Zusammenfassung:The extended X-ray absorption fine structure (EXAFS) associated with the Ge K X-ray absorption discontinuity in pure Ge and in the intermetallics RGe sub 2 (R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y) has been studied. The Ge--R distances in these compounds have been determined by comparing the experimental phase shifts with the theoretical ones. The Ge--R distances in the compounds TbGe sub 2 , HoGe sub 2 and ErGe sub 2 are reported for the first time in this work. 12 ref.--AA
ISSN:0304-4289