Silane dissociation mechanisms and thin film formation in a low pressure multipole dc discharge

A silane plasma is generated by a hot cathode dc discharge in a partially confining multipolar magnetic structure yielding hydrogenated amorphous silicon thin films on the walls. The low-pressure range (0.1–5 mTorr) allows the analysis of the elementary processes for SiH4 dissociation. At low silane...

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Veröffentlicht in:Applied physics letters 1980-01, Vol.37 (7), p.646-648
Hauptverfasser: Drevillon, B., Huc, J., Lloret, A., Perrin, J., de Rosny, G., Schmitt, J. P. M.
Format: Artikel
Sprache:eng
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Zusammenfassung:A silane plasma is generated by a hot cathode dc discharge in a partially confining multipolar magnetic structure yielding hydrogenated amorphous silicon thin films on the walls. The low-pressure range (0.1–5 mTorr) allows the analysis of the elementary processes for SiH4 dissociation. At low silane partial pressure the deposition rate remains in the range of 1–10 Å/sec, but the contribution of ions to deposition can reach up to 80% in contrast with standard glow discharges.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.92008