Measurement of the Si 32 Half-Life via Accelerator Mass Spectrometry
The half-life of Si-32 has been measured to be T(1/2) = 101 plus or minus 18 yr, considerably shorter than the previously accepted value of about 300 yr. The new value was obtained by measuring the specific beta activity with a liquid-scintillation-counter technique and the Si-32 concentration with...
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| Veröffentlicht in: | Physical review letters 1980-08, Vol.45 (8), p.592-596 |
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| container_end_page | 596 |
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| container_issue | 8 |
| container_start_page | 592 |
| container_title | Physical review letters |
| container_volume | 45 |
| creator | Kutschera, W. Henning, W. Paul, M. Smither, R. K. Stephenson, E. J. Yntema, J. L. Alburger, D. E. Cumming, J. B. Harbottle, G. |
| description | The half-life of Si-32 has been measured to be T(1/2) = 101 plus or minus 18 yr, considerably shorter than the previously accepted value of about 300 yr. The new value was obtained by measuring the specific beta activity with a liquid-scintillation-counter technique and the Si-32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si-32. |
| doi_str_mv | 10.1103/PhysRevLett.45.592 |
| format | Article |
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| identifier | ISSN: 0031-9007 |
| ispartof | Physical review letters, 1980-08, Vol.45 (8), p.592-596 |
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| language | eng |
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| source | APS: American Physical Society E-Journals (Physics) |
| title | Measurement of the Si 32 Half-Life via Accelerator Mass Spectrometry |
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