Measurement of the Si 32 Half-Life via Accelerator Mass Spectrometry

Measurement of the Si 32 Half-Life via Accelerator Mass Spectrometry

The half-life of Si-32 has been measured to be T(1/2) = 101 plus or minus 18 yr, considerably shorter than the previously accepted value of about 300 yr. The new value was obtained by measuring the specific beta activity with a liquid-scintillation-counter technique and the Si-32 concentration with...

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Veröffentlicht in:Physical review letters 1980-08, Vol.45 (8), p.592-596
Hauptverfasser: Kutschera, W., Henning, W., Paul, M., Smither, R. K., Stephenson, E. J., Yntema, J. L., Alburger, D. E., Cumming, J. B., Harbottle, G.
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Sprache:eng
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Zusammenfassung:The half-life of Si-32 has been measured to be T(1/2) = 101 plus or minus 18 yr, considerably shorter than the previously accepted value of about 300 yr. The new value was obtained by measuring the specific beta activity with a liquid-scintillation-counter technique and the Si-32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si-32.
ISSN:0031-9007
DOI:10.1103/PhysRevLett.45.592