Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows

Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows

Atom probe tomography (APT) is used to quantify atomic-scale elemental and isotopic compositional variations within a very small volume of material (typically

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2020-08, Vol.26 (4), p.750-757
Hauptverfasser: Rickard, William D.A., Reddy, Steven M., Saxey, David W., Fougerouse, Denis, Timms, Nicholas E., Daly, Luke, Peterman, Emily, Cavosie, Aaron J., Jourdan, Fred
Format: Artikel
Sprache:eng
Schlagworte:
Atom probe analysis
Australian Microbeam Analysis Society Special Section AMAS XV 2019
Hypodermic needles
Includes manuscripts developed from the 15th Biennial Symposium of the Australian Microbeam Analysis Society, Brighton, Victoria, Australia, 13–15 February 2019
Ion beams
Mapping
Mass spectrometry
Mass spectroscopy
Needles
Platinum
Scanning electron microscopy
Scientific imaging
Secondary ion mass spectrometry
Sensors
Sharpening
Software
Spatial discrimination
Spatial resolution
Tomography
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Atom probe tomography (APT) is used to quantify atomic-scale elemental and isotopic compositional variations within a very small volume of material (typically
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927620000136