Electrical Properties of Yttrium-Aluminum-Silicon Oxynitride Glasses

The ac electrical properties of several Y‐Al‐Si oxynitride glasses were measured as a function of temperature at 20° to 625°C in the frequency range 50 to 105 Hz. The low‐field dc conductivity was also determined. Dispersions in the dielectric constant associated with the peaks in the tan δ curves w...

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Veröffentlicht in:Journal of the American Ceramic Society 1980-01, Vol.63 (3-4), p.190-193
Hauptverfasser: LEEDECKE, C. J., LOEHMAN, RONALD E.
Format: Artikel
Sprache:eng
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Zusammenfassung:The ac electrical properties of several Y‐Al‐Si oxynitride glasses were measured as a function of temperature at 20° to 625°C in the frequency range 50 to 105 Hz. The low‐field dc conductivity was also determined. Dispersions in the dielectric constant associated with the peaks in the tan δ curves were observed in all cases. The peaks in tan δ shifted to higher frequencies with increasing temperature. Below ∼400°C, the ac conductivity was proportional to ωn with 0.5
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.1980.tb10689.x