Electrical Properties of Yttrium-Aluminum-Silicon Oxynitride Glasses
The ac electrical properties of several Y‐Al‐Si oxynitride glasses were measured as a function of temperature at 20° to 625°C in the frequency range 50 to 105 Hz. The low‐field dc conductivity was also determined. Dispersions in the dielectric constant associated with the peaks in the tan δ curves w...
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Veröffentlicht in: | Journal of the American Ceramic Society 1980-01, Vol.63 (3-4), p.190-193 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The ac electrical properties of several Y‐Al‐Si oxynitride glasses were measured as a function of temperature at 20° to 625°C in the frequency range 50 to 105 Hz. The low‐field dc conductivity was also determined. Dispersions in the dielectric constant associated with the peaks in the tan δ curves were observed in all cases. The peaks in tan δ shifted to higher frequencies with increasing temperature. Below ∼400°C, the ac conductivity was proportional to ωn with 0.5 |
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ISSN: | 0002-7820 1551-2916 |
DOI: | 10.1111/j.1151-2916.1980.tb10689.x |