Features of and in situ measurements on absorbing TiO sub / x/ films produced by reactive dc magnetron-plasmatron sputtering
Use of dc magnetron-plasmatron discharge allows direct production of TiO sub / x/ films with an O:Ti atomic ratio x = 0- 2 by varying the pO sub / 2/ pressure of an Ar-O sub / 2/ gas mixture. This method ensures reproducibility of the refractive index of TiO sub / 2/ films for dielectric multilayer...
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Veröffentlicht in: | Thin solid films 1980-01, Vol.72 (N-3), p.475-483 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Use of dc magnetron-plasmatron discharge allows direct production of TiO sub / x/ films with an O:Ti atomic ratio x = 0- 2 by varying the pO sub / 2/ pressure of an Ar-O sub / 2/ gas mixture. This method ensures reproducibility of the refractive index of TiO sub / 2/ films for dielectric multilayer stacks and gives absorbing TiO sub / x/ films with defined stoichiometries consistent with requirements for simple solar absorber systems. |
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ISSN: | 0040-6090 |