Determination of the orientation symmetry axis of graphite specimens

A technique is described for determining the true orientation symmetry axis of graphite specimens from conventional X-ray diffraction data. The technique, although developed for graphite, is applicable to any material exhibiting crystalline orientation which is symmetric about some axis. The requisite equations are derived for applying the procedure to both Bacon transmission data and rotating specimen reflection data. Results are presented which show that the symmetry axis of eleven molded graphites tested differed significantly from their nominal pressing directions.