A combined Monte Carlo diode simulation code
A collisional Monte Carlo electron transport model has been combined with an existing relativistic electron beam diode simulation code to investigate the effect of electron material interactions on diode performance. The effects of electron scattering and deposition in various anode materials on the...
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Veröffentlicht in: | J. Appl. Phys.; (United States) 1980-09, Vol.51 (9), p.4688-4692 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A collisional Monte Carlo electron transport model has been combined with an existing relativistic electron beam diode simulation code to investigate the effect of electron material interactions on diode performance. The effects of electron scattering and deposition in various anode materials on the electron beam profile are detailed. Simulations of two enhanced electron deposition experiments are described. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.328342 |