All-inorganic quantum dot assisted enhanced charge extraction across the interfaces of bulk organo-halide perovskites for efficient and stable pin-hole free perovskite solar cells

In spite of achieving high power conversion efficiency (PCE), organo-halide perovskites suffer from long term stability issues. Especially the grain boundaries of polycrystalline perovskite films are considered as giant trapping sites for photo-generated carriers and therefore play an important role...

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Veröffentlicht in:Chemical science (Cambridge) 2019-11, Vol.1 (41), p.953-9541
Hauptverfasser: Ghosh, Dibyendu, Chaudhary, Dhirendra K, Ali, Md. Yusuf, Chauhan, Kamlesh Kumar, Prodhan, Sayan, Bhattacharya, Sayantan, Ghosh, Barun, Datta, P. K, Ray, Sekhar C, Bhattacharyya, Sayan
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Sprache:eng
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Zusammenfassung:In spite of achieving high power conversion efficiency (PCE), organo-halide perovskites suffer from long term stability issues. Especially the grain boundaries of polycrystalline perovskite films are considered as giant trapping sites for photo-generated carriers and therefore play an important role in charge transportation dynamics. Surface engineering via grain boundary modification is the most promising way to resolve this issue. A unique antisolvent-cum-quantum dot (QD) assisted grain boundary modification approach has been employed for creating monolithically grained, pin-hole free perovskite films, wherein the choice of all-inorganic CsPbBr x I 3 x ( x = 12) QDs is significant. The grain boundary filling by QDs facilitates the formation of compact films with 12 m perovskite grains as compared to 300500 nm grains in the unmodified films. The solar cells fabricated by CsPbBr 1.5 I 1.5 QD modification yield a PCE of 16.5% as compared to 13% for the unmodified devices. X-ray photoelectron spectral analyses reveal that the sharing of electrons between the PbI 6 framework in the bulk perovskite and Br ions in CsPbBr 1.5 I 1.5 QDs facilitates the charge transfer process while femtosecond transient absorption spectroscopy (fs-TAS) suggests quicker trap filling and enhanced charge carrier recombination lifetime. Considerable ambient stability up to 720 h with
ISSN:2041-6520
2041-6539
DOI:10.1039/c9sc01183h